Deposition rate controller now supports multi-crystal sensors

Paul Boughton

The latest TMC13 Deposition Rate Controller from Henniker Scientific is further extended with 0.01Hz frequency resolution and support for multi-crystal sensors with each crystal being controlled individually.

It is a multi-channel device that has been designed for repeatebale, reliable and accurate control of film thickness and rate in vacuum based thin film deposition processes.

The touch-screen interface can be customised to suit a particular operator preference and can be operated in both automatic and manual modes, providing a direct display and control of film thickness, deposition rate and frequency value for up to six independent deposition sources.

The device also includes shutter relays for each channel, two analogue inputs for connection of pressure gauges, and two re-transmission analogue outputs as standard, as well as an extensive and fully editable materials library.

For more information, visit www.henniker-scientific.com