Microscopes locate hard-to-see defects
Sample inspection for difficult-to-inspect samples such as semiconductors, printed circuit boards and…
Solar cell design optimised through enhanced inspection
Digital light microscopy is advancing industrial inspection, and this has now enabled…
Enhancing flaw inspection
Olympus has announced the launch of its new IPLEX NX videoscope to…
Microscope and software enhances industrial inspection tasks
Olympus has launched its new modular BX3M upright microscope series and OLYMPUS…
A quantitative view of flexible electronics
Olympus LEXT OLS4100 confocal laser scanning microscope used as an alternative to…